User interface for WIR system

Wafer Inspection Reclassification (WIR) is the monotonous and repetitive task of manually checking semiconductor chips with an optical inspection system. An appropriate user interface was needed to minimise physical and mental strain for operators and help them to make the right decisions, faster.

Understand
After an examination of user requirements (documentation review, interviews with product experts and a field study of the operations), we came up with six scenarios of use.

Explore
We composed realistic stories to describe in detail how different user groups could use the future tool in a variety of contexts: different types of wafer, different locations, working offline/online or in different locations around the world.

Working closely with KLA Tencor R&D, we designed the user interface architecture with the dies overview and the re-classification wizard as the main features.

Our design for the user interface helped KLA Tencor to reduce the physical and mental strain for operators performing the Wafer Inspection Reclassification and allow them to make the right decisions, faster.